DocumentCode :
2033185
Title :
Nanophase semi-conductive ceramics: dielectric surface performance when exposed to charges
Author :
Fréchette, M.F. ; Larocque, R.Y. ; Blouin, Marco ; Boily, Sabin
Author_Institution :
Inst. de recherche d´´Hydro-Quebec, Que., Canada
fYear :
2004
fDate :
17-20 Oct. 2004
Firstpage :
326
Lastpage :
331
Abstract :
A nanophase composite that is a mix of a ceramic part and a metallic part was prepared by compacting agglomerated nanocrystals of each constituent, the ceramic and the metal. Considering the low Cu content, the resulting cermet was only mildly conductive at room temperature. An experiment was conceived to differentiate the dielectric performance of the nanophase semi-conductive ceramic from its counterpart, for which more extensive sintering had produced crystalline growth. It was found that the dielectric properties of the cermet differed based on the processing conditions. The solid-state sintered cermet still exhibited a microstructure with nanometric grains that was determinant in limiting the bulk and surface conductivity. In turn, the liquid-sintered cermet with its microstructure showing large grains was found to be a more conductive material. This difference in properties was illustrated by imaging charge accumulation and static breakdown at an interface cermet/epoxy.
Keywords :
cermets; copper; electrical conductivity; nanocomposites; particle reinforced composites; sintering; surface conductivity; Cu; Cu content; bulk conductivity; ceramic part; cermet/epoxy interface; charge exposure; compacted agglomerated nanocrystals; crystalline growth; dielectric surface performance; imaging charge accumulation; liquid-sintered cermet microstructure; metallic part; nanometric grains; nanophase composite; nanophase semi-conductive ceramics; sintering processing conditions; solid-state sintered cermet microstructure; static breakdown; surface conductivity; Ceramics; Conducting materials; Conductivity; Crystal microstructure; Crystallization; Dielectric materials; Electric breakdown; Nanocrystals; Solid state circuits; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN :
0-7803-8584-5
Type :
conf
DOI :
10.1109/CEIDP.2004.1364254
Filename :
1364254
Link To Document :
بازگشت