Title :
An efficient Nystr¨om scheme for solving volume integral equations
Author :
Tong, M.S. ; Qian, Z.G. ; Chew, W.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
An efficient Nystrom scheme is developed for solving three-dimensional (3D) electromagnetic (EM) problems by volume integral equations (VIEs). Although the surface integral equations (SIEs) are preferred whenever available, the VIEs are important and indispensable in the integral equation methods when the problems involve inho-mogeneous media. Currently, the VIEs are usually solved by the method of moments (MoM) and the Nystrom method as a good alternative for the MoM has not receive sufficient attention in the VIEs. In this work, we present an efficient Nystrom scheme for 3D VIEs based on a robust local correction method. The local correction method first interpolates the unknown function based on the quadrature points in the tetrahedral elements with self or near interactions, and then derives the solutions of the resulting hypersingular integrals from singularity subtraction in the Cauchy-principle-value (CPV) sense. Numerical examples for EM scattering by 3D penetrable objects are used to demonstrate the scheme.
Keywords :
computational electromagnetics; integral equations; integration; interpolation; method of moments; 3D electromagnetic problems; Cauchy-principle-value sense; Nystrom method; efficient Nystrom scheme; hypersingular integrals; inhomogeneous media; interpolation; local correction method; method of moments; quadrature points; robust local correction; singularity subtraction; surface integral equations; tetrahedral elements; volume integral equations; Computational electromagnetics; Dielectrics; Electromagnetic scattering; Integral equations; Magnetic fields; Moment methods; Nonhomogeneous media; Robustness; Sun; Testing;
Conference_Titel :
Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-3385-8
Electronic_ISBN :
978-1-4244-3386-5
DOI :
10.1109/ICEAA.2009.5297265