• DocumentCode
    2035048
  • Title

    Feature ranking for pattern recognition: A comparison of filter methods

  • Author

    Test, Erik ; Kecman, Vojislav ; Strack, Robert ; Li, Qi ; Salman, Raied

  • Author_Institution
    Virginia Commonwealth Univ., Richmond, VA, USA
  • fYear
    2012
  • fDate
    15-18 March 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents an approach for comparing various feature ranking (FR) methods. First, six classification benchmarks are created using Exhaustive Search (ES) to select the best feature subsets. The subset selections have been done within double (nested) cross-validation procedures guaranteeing realistic accuracy predictions to unseen examples. Next, seven filter FR approaches are compared and ranked in respect to the top five best feature subsets for each data set. This paper also introduces a method for quantifying and comparing FR results. The results hint that using Gini index or scatter ratios leads to rankings closest to ES on average.
  • Keywords
    filtering theory; pattern recognition; search problems; ES; FR methods; Gini index; double cross-validation procedures; exhaustive search; feature ranking methods; filter methods; pattern recognition; Accuracy; Benchmark testing; Glass; Indexes; Iris; Machine learning; Pattern recognition; Entropy; Exhaustive Search; Feature Ranking; Gini index; Scatter ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon, 2012 Proceedings of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1091-0050
  • Print_ISBN
    978-1-4673-1374-2
  • Type

    conf

  • DOI
    10.1109/SECon.2012.6196888
  • Filename
    6196888