DocumentCode :
2035048
Title :
Feature ranking for pattern recognition: A comparison of filter methods
Author :
Test, Erik ; Kecman, Vojislav ; Strack, Robert ; Li, Qi ; Salman, Raied
Author_Institution :
Virginia Commonwealth Univ., Richmond, VA, USA
fYear :
2012
fDate :
15-18 March 2012
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents an approach for comparing various feature ranking (FR) methods. First, six classification benchmarks are created using Exhaustive Search (ES) to select the best feature subsets. The subset selections have been done within double (nested) cross-validation procedures guaranteeing realistic accuracy predictions to unseen examples. Next, seven filter FR approaches are compared and ranked in respect to the top five best feature subsets for each data set. This paper also introduces a method for quantifying and comparing FR results. The results hint that using Gini index or scatter ratios leads to rankings closest to ES on average.
Keywords :
filtering theory; pattern recognition; search problems; ES; FR methods; Gini index; double cross-validation procedures; exhaustive search; feature ranking methods; filter methods; pattern recognition; Accuracy; Benchmark testing; Glass; Indexes; Iris; Machine learning; Pattern recognition; Entropy; Exhaustive Search; Feature Ranking; Gini index; Scatter ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon, 2012 Proceedings of IEEE
Conference_Location :
Orlando, FL
ISSN :
1091-0050
Print_ISBN :
978-1-4673-1374-2
Type :
conf
DOI :
10.1109/SECon.2012.6196888
Filename :
6196888
Link To Document :
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