DocumentCode
2035680
Title
Interfacing IEEE 1149.5 to IEEE 1149.1
Author
Young, Greg ; McHugh, Pat
Author_Institution
Texas Instrum. Inc., USA
fYear
1994
fDate
10-12 May 1994
Firstpage
768
Lastpage
781
Abstract
As today´s electronics systems increase in complexity, techniques allowing access to “low level” test resources (built-in self-test, boundary scan) are crucial for developing high fault coverage tests. Two IEEE test bus protocol standards have been defined to provide this access at the module (IEEE 1149.5) and device levels (IEEE 1149.1), respectively. This paper discusses the IEEE 1149.5 standard´s proposed method for interfacing to the IEEE 1149.1 boundary scan and the issues associated with this interfacing
Keywords
IEEE standards; boundary scan testing; built-in self test; protocols; IEEE 1149.1; IEEE 1149.5; IEEE test bus protocol standards; boundary scan; boundary scan testing; built-in self-test; Access protocols; Automatic testing; Backplanes; Built-in self-test; Controllability; Electronic equipment testing; Instruments; Master-slave; Observability; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/94 International. Conference Proceedings. Combined Volumes.
Conference_Location
Boston, MA
Print_ISBN
0-7803-2630-X
Type
conf
DOI
10.1109/ELECTR.1994.472647
Filename
472647
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