Title :
Picossecond testing and evaluation of three terminal devices
Author :
Fetterman, H.R. ; Matloubian, M. ; Plant, David V.
Author_Institution :
University of California
Keywords :
Frequency; Gallium arsenide; HEMTs; Indium gallium arsenide; Spectral analysis; Testing;
Conference_Titel :
Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics/Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control. LEOS 1991 Summer Topical Meetings on
DOI :
10.1109/LEOSST.1991.665293
