• DocumentCode
    20399
  • Title

    Experimental and Simulation Study of Double-Sided Flip-Chip Assembly With a Stiffener Ring

  • Author

    Xi Liu ; Ming Li ; Mullen, Donald R. ; Cline, Julia ; Sitaraman, Suresh K.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    14
  • Issue
    1
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    512
  • Lastpage
    522
  • Abstract
    The microelectronic packaging field is moving into the third dimension for miniaturization, low power consumption, and better performance. In this paper, we present a double-sided flip-chip (FC) organic substrate with a memory controller on one side of the package and 3-D stacked disaggregated memory chips on the other side of the package. This design allows the controller to interface with the DRAM stack directly through the substrate providing the shortest possible interconnect path and thus achieving the fastest signaling speed. However, this double-sided FC configuration also causes yield, assembly, test, and reliability challenges. In order to optimize the assembly process, elastic and viscoelastic sequential 3-D finite-element models are developed to simulate the package assembly process and are validated experimentally. In these simulations, various assembly process sequences are simulated with different conditions.
  • Keywords
    DRAM chips; assembling; electronics packaging; finite element analysis; flip-chip devices; 3D finite-element model; 3D stacked disaggregated memory chip; DRAM stack; double-sided FC configuration; double-sided flip-chip assembly; double-sided flip-chip organic substrate; low power consumption; memory controller; microelectronic packaging field; package assembly process; stiffener ring; viscoelastic sequential model; Assembly; Flip-chip devices; Substrates; Temperature; Temperature measurement; Three-dimensional displays; Assembly; double-sided flip-chip; electronic packaging; finite-element modeling; warpage;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2013.2283062
  • Filename
    6606807