Title :
Parametric modelling of the permittivity of dielectric materials
Author :
Van den Broeck, Tom ; Peirlinckx, Luc ; Guillaume, Patrick
Author_Institution :
Vrije Univ., Brussels, Belgium
Abstract :
In this paper a new method is proposed for measuring the complex permittivity of dielectric materials based on a parametric model and the use of a maximum likelihood estimator
Keywords :
dielectric-loaded waveguides; maximum likelihood estimation; modelling; numerical stability; parameter estimation; permittivity measurement; rectangular waveguides; time-domain analysis; transfer functions; S-parameters; complex permittivity measurement method; dielectric filled waveguide; dielectric materials; maximum likelihood estimator; model errors; numerical instabilities; parameter estimation; parametric model; physical constraints; poles and zeros; rational model; rectangular waveguide; time domain technique; transfer function model; Delay estimation; Dielectric materials; Electromagnetic measurements; Electromagnetic waveguides; Length measurement; Loss measurement; Parametric statistics; Permittivity measurement; Reflection; Scattering parameters;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507309
