Parametric modelling of the permittivity of dielectric materials

Author

Van den Broeck, Tom ; Peirlinckx, Luc ; Guillaume, Patrick

Author_Institution

Vrije Univ., Brussels, Belgium

Volume

2

fYear

1996

fDate

1996

Firstpage

963

Abstract

In this paper a new method is proposed for measuring the complex permittivity of dielectric materials based on a parametric model and the use of a maximum likelihood estimator

Keywords

dielectric-loaded waveguides; maximum likelihood estimation; modelling; numerical stability; parameter estimation; permittivity measurement; rectangular waveguides; time-domain analysis; transfer functions; S-parameters; complex permittivity measurement method; dielectric filled waveguide; dielectric materials; maximum likelihood estimator; model errors; numerical instabilities; parameter estimation; parametric model; physical constraints; poles and zeros; rational model; rectangular waveguide; time domain technique; transfer function model; Delay estimation; Dielectric materials; Electromagnetic measurements; Electromagnetic waveguides; Length measurement; Loss measurement; Parametric statistics; Permittivity measurement; Reflection; Scattering parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507309

Filename

507309