• DocumentCode
    2043969
  • Title

    An interactive real-time electromagnetic field analysis system for educational purposes

  • Author

    Mohammed, O. ; Minev, D. ; Castro, J. ; Roig, G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    158
  • Lastpage
    161
  • Abstract
    An interactive real-time electromagnetic field analysis system FieldVIEW is being developed at Florida International University with the intention of visualizing the electromagnetic process inside electrical machinery. The proposed system utilizes the finite element method with several hardware and software modules to achieve a real-time analysis of the electromagnetic field in a machine on which an experiment is being performed. Moreover, the intention is to develop a complete set of experiments that are processed in the energy conversion lab, which will allow the user not only to observe, but also to control the system and perform the whole experiment using a computer. As a result the user of this system will have better understanding of the energy conversion concepts as well as the electromagnetic field associated with electrical machinery
  • Keywords
    computer aided instruction; electric machines; electrical engineering computing; electrical engineering education; electromagnetic fields; finite element analysis; interactive systems; real-time systems; software packages; FieldVIEW; Florida International University; educational purposes; electromagnetic process visualisation; energy conversion lab; finite element method; hardware modules; interactive real-time electromagnetic field analysis system; real-time analysis; software modules; Electromagnetic analysis; Electromagnetic fields; Energy conversion; Finite element methods; Hardware; Machinery; Performance analysis; Real time systems; Software performance; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon 2000. Proceedings of the IEEE
  • Conference_Location
    Nasville, TN
  • Print_ISBN
    0-7803-6312-4
  • Type

    conf

  • DOI
    10.1109/SECON.2000.845455
  • Filename
    845455