• DocumentCode
    2045339
  • Title

    SF6-N2 gas mixtures-electrical insulation and discharge development under fast oscillating impulse conditions in a non-uniform gap

  • Author

    Schröder, Gero

  • Author_Institution
    Inst. fur Allhemeine Elektrotech. & Hochspannungstech., Tech. Hochschule Aachen, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    280
  • Lastpage
    283
  • Abstract
    The insulation performance of SF6-gas insulated switchgear GIS is strongly reduced in the case of non-uniform fields. From this the discharge development in a coaxial electrode configuration with a needle protrusion, fixed on the inner conductor, was investigated for different SF6/N2 gas mixtures (5/95, 30/70) and pressures (0.1 to 0.3 MPa). The configuration was stressed by applying low damped monofrequent oscillations up to 10 MHz with amplitudes of about 300 kV. The different gas mixtures are compared with pure SF6 and nitrogen (N2). The local extension of the discharge light emission was recorded by a high speed image converter camera. Different figures of streak records are presented and illustrate the influence of the SF6 percentage, the VFT frequency and the entire gas pressure on the discharge development. The results of the experimental investigation show that in general the discharge development in gas mixtures progresses similar, but not in the same patterns known for pure SF6
  • Keywords
    SF6 insulation; gas insulated switchgear; gas mixtures; partial discharges; 0.1 to 0.3 MPa; SF6; SF6-N2; SF6-gas insulated switchgear; coaxial electrode configuration; discharge development; fast oscillating impulse conditions; insulation performance; needle protrusion; nonuniform gap; streak records; Cameras; Coaxial components; Conductors; Electrodes; Geographic Information Systems; Image converters; Insulation; Needles; Nitrogen; Switchgear;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-5931-3
  • Type

    conf

  • DOI
    10.1109/ELINSL.2000.845507
  • Filename
    845507