• DocumentCode
    2045653
  • Title

    Field Emission Characteristics of ZnO Nanowire and Its Application to Luminescent Tubes

  • Author

    Ke, Y.L. ; Chen, H.J. ; Chen, Jun ; Deng, S.Z. ; Xu, N.S.

  • Author_Institution
    State Key Lab. of Optoelectron. Mater. & Technol., Zhongshan Univ., Guangzhou
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    477
  • Lastpage
    478
  • Abstract
    ZnO nanowire films were grown on stainless-steel disc with a thin layer of Au as catalyst by thermal evaporation in a vacuum chamber. Morphology of the nanowires was investigated by scanning electron microscopy, while emission site distribution images were recorded by a CCD camera. The nanowires were then used as cathodes in a luminescent tube and its turn-on and threshold voltages and fields, and DC power consumption properties were studied. The luminescent tube exhibited low operation voltage and low power consumption
  • Keywords
    II-VI semiconductors; cathodes; electron field emission; electron tubes; luminescent devices; nanoelectronics; nanowires; scanning electron microscopy; semiconductor thin films; vacuum deposited coatings; vacuum microelectronics; wide band gap semiconductors; zinc compounds; CCD camera; DC power consumption; ZnO; charge-coupled device; emission site distribution images; field emission properties; luminescent tubes; nanowire films; nanowire morphology; operation voltage; scanning electron microscopy; stainless-steel disc; thermal evaporation; thin Au catalyst layer; threshold field; threshold voltage; turn-on field; turn-on voltage; vacuum chamber; Cathodes; Charge coupled devices; Charge-coupled image sensors; Electron emission; Energy consumption; Gold; Morphology; Scanning electron microscopy; Threshold voltage; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
  • Conference_Location
    Guilin
  • Print_ISBN
    1-4244-0401-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2006.335275
  • Filename
    4134667