DocumentCode
2045979
Title
Interfacial Partitioning in Single Crystal Ru-bearing Superalloys
Author
Miller, M.K. ; Russell, K.F. ; Tin, S.
Author_Institution
Div. of Mater. Sci. & Technol., Oak Ridge Nat. Lab., TN
fYear
2006
fDate
38899
Firstpage
509
Lastpage
510
Abstract
In this paper, local electrode atom probe is used to characterize the differences in interfacial partitioning that occurs between the TCP, gamma and gammasquare phases in single-crystal Ru-bearing Ni-based superalloys. Identification of the compositional variations in the topologically-close-packed (TCP) phases is also presented
Keywords
atom probe field ion microscopy; crystal microstructure; nickel alloys; ruthenium alloys; superalloys; TCP phases; crystal microstructure; gamma phase; interfacial partitioning; local electrode atom probe; single-crystal Ru-bearing superalloys; topologically-close-packed phases; Aerospace materials; Composite materials; Crystalline materials; Electron beams; Laboratories; Materials science and technology; Mechanical factors; Probes; Temperature; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location
Guilin
Print_ISBN
1-4244-0401-0
Type
conf
DOI
10.1109/IVNC.2006.335300
Filename
4134683
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