DocumentCode :
2046413
Title :
Calculation model for the induced voltage of pick-up coil excited by rectangular coil above conductive plate
Author :
Siquan Zhang ; Jiangfeng Tang ; Weihua Wu
Author_Institution :
Dept. of Electr. Autom., Shanghai Maritime Univ., Shanghai, China
fYear :
2015
fDate :
2-5 Aug. 2015
Firstpage :
1805
Lastpage :
1810
Abstract :
The electromagnetic NDT method plays an important role in the nondestructive material test. In testing conductive structures, the send-receive coils probe has more advantage than the absolute coil probe. One rectangular excitation coil is located above and parallel to moving conductive plate, another cylindrical pick-up coil is located on the opposite side across the moving conductive plate. The accurate theoretical expression of the induced voltage in the pick-up coil is derived by analytical method, then the influences of the excitation frequency, plate thickness and the moving speed of conductor to the induced voltage are analyzed. The analytical calculation results are verified with the implementation of finite element method.
Keywords :
coils; eddy current testing; finite element analysis; plates (structures); conductive plate; conductive structures; cylindrical pick-up coil; electromagnetic NDT; finite element method; induced voltage; nondestructive material test; plate thickness; rectangular excitation coil; send-receive coils; Conductors; Eddy current testing; Finite element analysis; Magnetic flux density; Probes; Conductive plate; Eddy current testing; Finite element method; Induced voltage; Rectangular excitation coil;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mechatronics and Automation (ICMA), 2015 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7097-1
Type :
conf
DOI :
10.1109/ICMA.2015.7237760
Filename :
7237760
Link To Document :
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