DocumentCode :
2046968
Title :
The study of self-alignment capability of electrically conductive adhesives (ECAs) using low melting point alloy for flip-chip application
Author :
Wong, C.P. ; Moon, Kyoung-Sik
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2001
fDate :
21-24 Oct. 2001
Firstpage :
112
Lastpage :
118
Abstract :
A feasibility study of the self-alignment capability of electrically conductive adhesives (ECAs) for a flip-chip interconnection application was carried out. The effect of the low melting alloy (LMA) filler on the self-alignment capability of ECAs was investigated. The surface energy of the epoxy resin was studied in terms of the various additives and their loading level using a goniometer with a built-in environmental chamber. The curing profile of the epoxy resin and the melting point of the LMA filler were measured using a differential scanning calorimeter (DSC). The ECAs filled with the LMA over 85 wt% showed self-alignment during the heating process. However, when silver flakes were added to the ECA formulation, self-alignment did not take place. We concluded that the LMA filler depleted into the silver flakes can adversely affect the self-alignment of ECAs. The key parameters required for ECA self-alignment capability are presented. This paper discusses the feasibility of the application of ECA with self-alignment capability for flip-chip interconnection. Initial results from these series studies indicate that incorporation of the LMA into ECAs is an efficient way to make ECAs with self-alignment capability.
Keywords :
adhesives; conducting polymers; differential scanning calorimetry; filled polymers; flip-chip devices; goniometers; heat treatment; integrated circuit interconnections; integrated circuit packaging; melting point; surface energy; Ag; DSC; ECA formulation; ECAs; LMA filler; additive loading level; additives; curing profile; differential scanning calorimeter; electrically conductive adhesives; environmental chamber; epoxy resin; flip-chip application; flip-chip interconnection; goniometer; low melting point alloy; melting point; self-alignment; self-alignment capability; silver flakes; surface energy; Conducting materials; Conductive adhesives; Epoxy resins; Independent component analysis; Integrated circuit interconnections; Materials science and technology; Silver; Surface tension; Surface-mount technology; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
Conference_Location :
Potsdam, Germany
Print_ISBN :
0-7803-7220-4
Type :
conf
DOI :
10.1109/POLYTR.2001.973267
Filename :
973267
Link To Document :
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