DocumentCode
2047045
Title
Advanced flip chip encapsulation: transfer molding process for simultaneous underfilling and postencapsulation
Author
Becker, Karl-F ; Braun, T. ; Koch, M. ; Ansorge, F. ; Aschenbrenner, R. ; Reichl, H.
Author_Institution
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
fYear
2001
fDate
21-24 Oct. 2001
Firstpage
130
Lastpage
139
Abstract
The process development for four flip chip molding compounds was based on material characterization by DSC, DMA and TMA. It was shown that the materials tested do allow reliable flip chip molding. Materials properties concerning processability and reliability are promising. There is strong potential of the technology for the increasing market of flip chip packages as certain types of BGA´s and, with further miniaturization, CSP´s. As these packages incorporate typically single dies, the transfer mold process can be adapted without major changes to existing equipment. Even for future developments such as one chip flip chip SIP´s using advanced IC thinning and assembly methods, the flip chip molding underfill process is a successful vision for reliable encapsulation.
Keywords
Young´s modulus; ball grid arrays; chip scale packaging; circuit reliability; differential scanning calorimetry; encapsulation; flip-chip devices; glass transition; moulding; BGA; CSP; DMA; DSC; IC thinning; TMA; flip chip encapsulation; flip chip molding compounds; material characterization; postencapsulation; processability; reliability; single dies; transfer molding process; underfilling; Costs; Electronic packaging thermal management; Electronics packaging; Encapsulation; Flip chip; Impedance; Semiconductor device packaging; Surfaces; Throughput; Transfer molding;
fLanguage
English
Publisher
ieee
Conference_Titel
Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
Conference_Location
Potsdam, Germany
Print_ISBN
0-7803-7220-4
Type
conf
DOI
10.1109/POLYTR.2001.973270
Filename
973270
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