• DocumentCode
    2047045
  • Title

    Advanced flip chip encapsulation: transfer molding process for simultaneous underfilling and postencapsulation

  • Author

    Becker, Karl-F ; Braun, T. ; Koch, M. ; Ansorge, F. ; Aschenbrenner, R. ; Reichl, H.

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
  • fYear
    2001
  • fDate
    21-24 Oct. 2001
  • Firstpage
    130
  • Lastpage
    139
  • Abstract
    The process development for four flip chip molding compounds was based on material characterization by DSC, DMA and TMA. It was shown that the materials tested do allow reliable flip chip molding. Materials properties concerning processability and reliability are promising. There is strong potential of the technology for the increasing market of flip chip packages as certain types of BGA´s and, with further miniaturization, CSP´s. As these packages incorporate typically single dies, the transfer mold process can be adapted without major changes to existing equipment. Even for future developments such as one chip flip chip SIP´s using advanced IC thinning and assembly methods, the flip chip molding underfill process is a successful vision for reliable encapsulation.
  • Keywords
    Young´s modulus; ball grid arrays; chip scale packaging; circuit reliability; differential scanning calorimetry; encapsulation; flip-chip devices; glass transition; moulding; BGA; CSP; DMA; DSC; IC thinning; TMA; flip chip encapsulation; flip chip molding compounds; material characterization; postencapsulation; processability; reliability; single dies; transfer molding process; underfilling; Costs; Electronic packaging thermal management; Electronics packaging; Encapsulation; Flip chip; Impedance; Semiconductor device packaging; Surfaces; Throughput; Transfer molding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
  • Conference_Location
    Potsdam, Germany
  • Print_ISBN
    0-7803-7220-4
  • Type

    conf

  • DOI
    10.1109/POLYTR.2001.973270
  • Filename
    973270