Early capture for boundary scan timing measurements

Author

Lofstrom, Keith

Author_Institution

KLIC, Beaverton, OR, USA

fYear

1996

fDate

20-25 Oct 1996

Firstpage

417

Lastpage

422

Abstract

Analog waveforms and delays can be measured using a simple extension of the IEEE 1149.X standards. Early capture samples data on a falling edge of TMS during the Update-DR state. Experiments suggest sub-nanosecond timing resolution

Keywords

IEEE standards; analogue integrated circuits; automatic testing; boundary scan testing; delays; electronic equipment testing; integrated circuit testing; measurement standards; mixed analogue-digital integrated circuits; signal sampling; timing; IEEE 1149.X standards; Update-DR state; analog waveforms; boundary scan timing measurements; comparator; falling edge; high speed testing; mixed signal testing; propagation delays; samples data; subnanosecond timing resolution; Circuit testing; Clocks; Frequency synchronization; Logic testing; Oscilloscopes; Probes; Propagation delay; Semiconductor device measurement; System testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.557045

Filename

557045

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2047321