DocumentCode :
2047539
Title :
Crack initiation and growth during low cycle fatigue of Pb-Sn solder joints
Author :
Guo, Z. ; Sprecher, A.F. ; Conrad, H.
Author_Institution :
Dept. of Mater. Sci. & Eng., North Carolina State Univ., Raleigh, NC, USA
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
658
Lastpage :
666
Abstract :
The initiation and growth of fatigue cracks during low-cycle fatigue of Pb-Sn solder joints (60Sn-40Pb and 75Sn-25Pb) in shear at 300 K were followed employing two techniques: (a) surface examination by low-power optical microscopy and (b) liquid N2 cracking of fatigued specimens. Cracks 50 to 100 μm long were first detected by the optical microscopy examination of the specimen surface at the beginning of Stage II of the load drop parameter φ vs. N curve. These cracks then grew as the specimen was cycled further into Stage II. SEM fractographs of fatigued specimens broken after immersion in liquid N2 revealed that fatigue cracks initiated mainly at the external surface and at the internal voids and grew by cracking along all three of the common paths: eutectic colony boundaries, grain boundaries, and across the colonies, i.e., a transgranular path. The drop in load which occurred during the fatigue test was established to be proportional to the fatigue cracked area
Keywords :
fatigue cracks; lead alloys; optical microscopy; scanning electron microscope examination of materials; soldering; tin alloys; 300 K; Pb-Sn solder joints; SEM fractographs; eutectic colony boundaries; external surface; fatigue cracks; grain boundaries; internal voids; liquid N2 cracking; load drop parameter; low cycle fatigue; low-power optical microscopy; surface examination; transgranular path; Capacitive sensors; Fatigue; Fixtures; Materials science and technology; Optical microscopy; Scanning electron microscopy; Soldering; Surface cracks; Tensile stress; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163950
Filename :
163950
Link To Document :
بازگشت