Limitations of fault injection attack based on immunity to radiated EM field standards

Fault injection using electromagnetic pulse is a promising technique for extracting secrets from an integrated circuit. Indeed, among other benefits, it does not need a preparation phase, delicate and costly, as attack using a LASER does. In the field of electromagnetic compatibility, a large set of standards describe how to assess the immunity to electromagnetic radiations of a system or an integrated circuit. In this paper, we show the limitations of their usage to carry out fault injection attack.