Title :
Soft X-ray diffraction: an element sensitive tool to characterize patterned arrays of nanomagnets
Author :
Sánchez-Hanke, C. ; Castaño, F.J. ; Hao, Y. ; Ross, C.A. ; Smith, H.I. ; Kao, C.-C.
Author_Institution :
Nat. Synchrotron Light Source, Brookhaven Nat. Lab., Upton, NY, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we show that diffraction experiments, performed using elliptically polarized soft X-rays, can be used to characterize the structure as well as the magnetic behavior of these lithographically-defined arrays of nanomagnets.
Keywords :
X-ray diffraction; cobalt; ferromagnetic materials; magnetic hysteresis; magnetic particles; nanostructured materials; Co; lithographically-defined arrays; magnetic properties; nanomagnets; Diffraction gratings; Light scattering; Magnetic field measurement; Optical polarization; Particle scattering; Resonance light scattering; X-ray detection; X-ray detectors; X-ray diffraction; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230667
