DocumentCode
2052018
Title
The final barriers to widespread use of IDDQ testing
Author
Acken, John M.
Author_Institution
CrossCheck Technol. Inc., San Jose, CA, USA
fYear
1995
fDate
21-25 Oct 1995
Firstpage
300
Abstract
IDDQ testing is required for high quality products. Several barriers to IDDQ testing have fallen. This is due to the rising importance of testing, quality, and CAD tool integration of design and test. Both theory and practice have demonstrated the value of IDDQ testing methodologies. Three key issues still hinder widespread utilization of IDDQ. The first issue is how does I DDQ compete with other test methods. The second issue is what measurement techniques can be used. And the third issue is how to set the IDDQ current limit to catch defective parts without rejecting defect-free parts. The thesis of this presentation is that the issues are being actively worked, and the barriers will fall
Keywords
CMOS integrated circuits; automatic testing; circuit CAD; design for testability; electric current measurement; integrated circuit testing; CAD tool integration; CMOS IC; IDDQ testing; barriers; defect-free parts; defective parts; high quality products; Batteries; Circuit testing; Current measurement; Current supplies; Design automation; Fabrication; Measurement techniques; Power supplies; Semiconductor device measurement; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529852
Filename
529852
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