• DocumentCode
    2052018
  • Title

    The final barriers to widespread use of IDDQ testing

  • Author

    Acken, John M.

  • Author_Institution
    CrossCheck Technol. Inc., San Jose, CA, USA
  • fYear
    1995
  • fDate
    21-25 Oct 1995
  • Firstpage
    300
  • Abstract
    IDDQ testing is required for high quality products. Several barriers to IDDQ testing have fallen. This is due to the rising importance of testing, quality, and CAD tool integration of design and test. Both theory and practice have demonstrated the value of IDDQ testing methodologies. Three key issues still hinder widespread utilization of IDDQ. The first issue is how does I DDQ compete with other test methods. The second issue is what measurement techniques can be used. And the third issue is how to set the IDDQ current limit to catch defective parts without rejecting defect-free parts. The thesis of this presentation is that the issues are being actively worked, and the barriers will fall
  • Keywords
    CMOS integrated circuits; automatic testing; circuit CAD; design for testability; electric current measurement; integrated circuit testing; CAD tool integration; CMOS IC; IDDQ testing; barriers; defect-free parts; defective parts; high quality products; Batteries; Circuit testing; Current measurement; Current supplies; Design automation; Fabrication; Measurement techniques; Power supplies; Semiconductor device measurement; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1995. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2992-9
  • Type

    conf

  • DOI
    10.1109/TEST.1995.529852
  • Filename
    529852