DocumentCode
2052741
Title
SPC on the IC-production test process
Author
Van der Peet, Jos ; Van Boxem, Ger
Author_Institution
Consumer IC Ind., Philips Semicond. BV, Nijmegen, Netherlands
fYear
1996
fDate
20-25 Oct 1996
Firstpage
605
Lastpage
610
Abstract
A novel monitor for the error sources of the test process is found. It is independent of the tested product and does not disturb the production flow. It can be used to control the test process during production (SPC). Implementation of SPC using these monitors is described, with results and conclusions
Keywords
computerised monitoring; integrated circuit testing; integrated circuit yield; production engineering computing; production testing; statistical process control; IC-production test process; SPC; SPC software tool; error source monitoring; monitor; test process control; yield improvement; Condition monitoring; Flow production systems; Fluid flow measurement; Information analysis; Integrated circuit noise; Integrated circuit testing; Process control; Production facilities; Reproducibility of results; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1996. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-3541-4
Type
conf
DOI
10.1109/TEST.1996.557117
Filename
557117
Link To Document