fDate :
April 27 2008-May 1 2008
Abstract :
Contains an entry for each author and co-author included in this issue of the publication.
Keywords :
Biographies; CMOS technology; Circuit simulation; Electrical engineering; Integrated circuit technology; Materials science and technology; Physics; Radiation effects; Reliability engineering; Space technology;
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
DOI :
10.1109/RELPHY.2008.4559019
