• DocumentCode
    2057745
  • Title

    Realistic faults mapping scheme for the fault simulation of integrated analogue CMOS circuits

  • Author

    Ohletz, Michael J.

  • Author_Institution
    Inst. fur Theor. Elektrotech., Hannover Univ., Germany
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    776
  • Lastpage
    785
  • Abstract
    A new fault modelling scheme for integrated analogue CMOS circuits referred to as Local Layout Realistic Fault Mapping is introduced. It is aimed at realistic fault assumptions prior to the final layout by investigating typical “local” layout structures of analogue designs. Specific defects are assumed and their electrical failure modes are evaluated and mapped onto appropriate model faults. It is shown that some assumed hard faults at the schematic level are unrealistic and unlikely and that new types of fault constellations emerge including multiple or complex faults. Beside the different distribution of faults the overall number of faults decreases whereof additional realistic soft faults emerge. For an operational CMOS amplifier the overall number of 47 single hard faults assumed at schematic level dropped to 27 realistic and likely hard faults
  • Keywords
    CMOS analogue integrated circuits; circuit analysis computing; digital simulation; failure analysis; fault diagnosis; integrated circuit layout; integrated circuit testing; operational amplifiers; complex faults; electrical failure modes; fault constellations; fault simulation; integrated analogue CMOS circuits; local layout realistic fault mapping; operational CMOS amplifier; schematic level; single hard faults; Analytical models; CMOS analog integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Electric variables; Failure analysis; Performance analysis; Production; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557137
  • Filename
    557137