DocumentCode :
2059594
Title :
Commercial design verification: methodology and tools
Author :
Pixley, Carl ; Strader, Noel R. ; Bruce, W.C. ; Park, Jaehong ; Kaufmann, Matt ; Shultz, Kurt ; Burns, Michael ; Kumar, Jai ; Yuan, Jun ; Nguyen, Janet
Author_Institution :
Adv. Design Technol., Motorola Inc., Austin, TX, USA
fYear :
1996
fDate :
20-25 Oct 1996
Firstpage :
839
Lastpage :
848
Abstract :
Commercial design verification is a complex activity involving many abstraction levels (such as architectural, register transfer, gate, switch, circuit, fabrication), many different aspects of design (such as timing, speed, functional, power, reliability and manufacturability) and many different design styles (such as ASIC, full custom, semi-custom, memory, cores, and asynchronous). We present a representative design flow and methodology that is common to many commercial integrated circuit design environments and that concentrates on functional validation using informal verification (e.g., simulation, emulation and ATPG) and formal verification (e.g., logic checking and sequential verification)
Keywords :
automatic testing; computational complexity; design for testability; digital simulation; formal verification; integrated circuit design; logic CAD; logic testing; random processes; ATPG; abstraction levels; commercial design verification; design flow; emulation; emulation throughput; formal verification; functional validation; informal verification; integrated circuit design environment; logic checking; sequential verification; simulation; simulation coverage; simulation monitoring; Application specific integrated circuits; Design methodology; Fabrication; Integrated circuit reliability; Integrated circuit synthesis; Manufacturing; Registers; Switches; Switching circuits; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-3541-4
Type :
conf
DOI :
10.1109/TEST.1996.557145
Filename :
557145
Link To Document :
بازگشت