Title :
The validation of message specifications based on Iec 61968 standards
Author :
Yang Yu ; Dong Liu ; Yiming Lu ; Jianwei Gu
Author_Institution :
Dept. of Electr. Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
As the information standardization of smart grid gradually develops, the electric utilities are devoted to constructing the enterprise information integrated architecture based on the enterprise service bus according to IEC 61968 standards. However, in the implementation process, the consistency of message specification has not been well applied. In order to solve the problems or mismatches that appear in the information interaction, this paper proposes a practical validation mechanism for information interaction based on IEC 61968 standards, and describes the method for message validation based on XML Schema. The paper also includes a description of the M2VT (Model and Message Validation Tool) software tool, which establishes the consistency rules of the data model through analyzing the mapping relationship between XML and XML schema (XSD), to realize the checking function on the validity of the message (described in XML). The online testing in the integration bus of Hangzhou DMS system with this tool proves its feasibility and practicability.
Keywords :
IEC standards; XML; data models; distribution networks; formal verification; message passing; power engineering computing; smart power grids; software architecture; Hangzhou DMS system; IEC 61968 standards; M2VT software tool; XML Schema; XSD; consistency rules; data model; electric utilities; enterprise information integrated architecture; enterprise service bus; information interaction; information standardization; integration bus; mapping relationship; message specification consistency; message specification validation; model and message validation tool; online testing; smart grid; IEC61968; Information integration; Message; Validation;
Conference_Titel :
Electricity Distribution (CICED), 2012 China International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-6065-4
Electronic_ISBN :
2161-7481
DOI :
10.1109/CICED.2012.6508639