DocumentCode
2061981
Title
Self-aligned multilayer dielectric “dummy gate” technology for L-, S- and X-band GaAs MMICs fabrication
Author
Anishchenko, Ekaterina V. ; Arykov, Vadim S. ; Gavrilova, Anastasiya M. ; Dedkova, Olga A. ; Kagadei, Valery A. ; Kamchatnaya, Oxana V. ; Lilenko, Yury V. ; Yushenko, Aleksey Yu
Author_Institution
Res. & Production Co. Micran, Tomsk, Russia
fYear
2010
fDate
9-11 Dec. 2010
Firstpage
37
Lastpage
40
Abstract
This paper demonstrates the main aspects of the technology for GaAs microwave monolithic integrated circuits fabrication. The self-aligned technology with multilayer dielectric “dummy gate” used for fabrication of the metal-semiconductor field effect transistor with 0.5 microns gate length and ion implantation for channel, drain and source regions formation is described. Methods of front- and backside processing and specifications of control MMICs such as L-, S- and X-band switches, attenuators and phase-shifters are described.
Keywords
III-V semiconductors; MMIC; Schottky gate field effect transistors; attenuators; gallium arsenide; ion implantation; multilayers; phase shifters; semiconductor-metal boundaries; GaAs; GaAs microwave monolithic integrated circuits fabrication; L-band GaAs MMIC fabrication; L-band switches; S-band GaAs MMIC fabrication; S-band switches; X-band GaAs MMIC fabrication; X-band switches; attenuators; dielectric dummy gate technology; ion implantation; metal-semiconductor field effect transistor fabrication; phase-shifters; self-aligned multilayer; size 0.5 micron; source regions formation; Dielectrics; Fabrication; Gallium arsenide; Insertion loss; Logic gates; MESFETs; MMICs; AESA; Gallium arsenide; MESFET; dummy gate; ion implantation;
fLanguage
English
Publisher
ieee
Conference_Titel
Fundamental Problems of Micro/Nanosystems Technologies (MNST), 2010 IEEE 2nd Russia School and Seminar on
Conference_Location
Novosibirsk
Print_ISBN
978-1-4244-5962-9
Electronic_ISBN
978-1-4244-5963-6
Type
conf
DOI
10.1109/MNST.2010.5687133
Filename
5687133
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