• DocumentCode
    2061981
  • Title

    Self-aligned multilayer dielectric “dummy gate” technology for L-, S- and X-band GaAs MMICs fabrication

  • Author

    Anishchenko, Ekaterina V. ; Arykov, Vadim S. ; Gavrilova, Anastasiya M. ; Dedkova, Olga A. ; Kagadei, Valery A. ; Kamchatnaya, Oxana V. ; Lilenko, Yury V. ; Yushenko, Aleksey Yu

  • Author_Institution
    Res. & Production Co. Micran, Tomsk, Russia
  • fYear
    2010
  • fDate
    9-11 Dec. 2010
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    This paper demonstrates the main aspects of the technology for GaAs microwave monolithic integrated circuits fabrication. The self-aligned technology with multilayer dielectric “dummy gate” used for fabrication of the metal-semiconductor field effect transistor with 0.5 microns gate length and ion implantation for channel, drain and source regions formation is described. Methods of front- and backside processing and specifications of control MMICs such as L-, S- and X-band switches, attenuators and phase-shifters are described.
  • Keywords
    III-V semiconductors; MMIC; Schottky gate field effect transistors; attenuators; gallium arsenide; ion implantation; multilayers; phase shifters; semiconductor-metal boundaries; GaAs; GaAs microwave monolithic integrated circuits fabrication; L-band GaAs MMIC fabrication; L-band switches; S-band GaAs MMIC fabrication; S-band switches; X-band GaAs MMIC fabrication; X-band switches; attenuators; dielectric dummy gate technology; ion implantation; metal-semiconductor field effect transistor fabrication; phase-shifters; self-aligned multilayer; size 0.5 micron; source regions formation; Dielectrics; Fabrication; Gallium arsenide; Insertion loss; Logic gates; MESFETs; MMICs; AESA; Gallium arsenide; MESFET; dummy gate; ion implantation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fundamental Problems of Micro/Nanosystems Technologies (MNST), 2010 IEEE 2nd Russia School and Seminar on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4244-5962-9
  • Electronic_ISBN
    978-1-4244-5963-6
  • Type

    conf

  • DOI
    10.1109/MNST.2010.5687133
  • Filename
    5687133