DocumentCode
2062276
Title
An efficient proximity probing algorithm for metrology
Author
Panahi, Fatemeh ; Adler, Aviv ; van der Stappen, A. Frank ; Goldberg, K.
Author_Institution
Dept. of Inf. & Comput. Sci., Utrecht Univ., Utrecht, Netherlands
fYear
2013
fDate
17-20 Aug. 2013
Firstpage
342
Lastpage
349
Abstract
Metrology, the theoretical and practical study of measurement, has applications in automated manufacturing, inspection, robotics, surveying, and healthcare. An important problem within metrology is how to interactively use a measuring device, or probe, to determine some geometric property of an unknown object; this problem is known as geometric probing. In this paper, we study a type of proximity probe which, given a point, returns the distance to the boundary of the object in question. We consider the case where the object is a convex polygon P in the plane, and the goal of the algorithm is to minimize the upper bound on the number of measurements necessary to exactly determine P. We show an algorithm which has an upper bound of 3.5n + k + 2 measurements necessary, where n is the number of vertices and k ≤ 3 is the number of acute angles of P. Furthermore, we show that our algorithm requires O(1) computations per probe, and hence O(n) time to determine P.
Keywords
measurement systems; probes; O(1) computations; convex polygon; metrology; proximity probing algorithm; upper bound; Clocks; Manufacturing; Metrology; Probes; Robots; Semiconductor device measurement; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Science and Engineering (CASE), 2013 IEEE International Conference on
Conference_Location
Madison, WI
ISSN
2161-8070
Type
conf
DOI
10.1109/CoASE.2013.6653995
Filename
6653995
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