• DocumentCode
    2062276
  • Title

    An efficient proximity probing algorithm for metrology

  • Author

    Panahi, Fatemeh ; Adler, Aviv ; van der Stappen, A. Frank ; Goldberg, K.

  • Author_Institution
    Dept. of Inf. & Comput. Sci., Utrecht Univ., Utrecht, Netherlands
  • fYear
    2013
  • fDate
    17-20 Aug. 2013
  • Firstpage
    342
  • Lastpage
    349
  • Abstract
    Metrology, the theoretical and practical study of measurement, has applications in automated manufacturing, inspection, robotics, surveying, and healthcare. An important problem within metrology is how to interactively use a measuring device, or probe, to determine some geometric property of an unknown object; this problem is known as geometric probing. In this paper, we study a type of proximity probe which, given a point, returns the distance to the boundary of the object in question. We consider the case where the object is a convex polygon P in the plane, and the goal of the algorithm is to minimize the upper bound on the number of measurements necessary to exactly determine P. We show an algorithm which has an upper bound of 3.5n + k + 2 measurements necessary, where n is the number of vertices and k ≤ 3 is the number of acute angles of P. Furthermore, we show that our algorithm requires O(1) computations per probe, and hence O(n) time to determine P.
  • Keywords
    measurement systems; probes; O(1) computations; convex polygon; metrology; proximity probing algorithm; upper bound; Clocks; Manufacturing; Metrology; Probes; Robots; Semiconductor device measurement; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2013 IEEE International Conference on
  • Conference_Location
    Madison, WI
  • ISSN
    2161-8070
  • Type

    conf

  • DOI
    10.1109/CoASE.2013.6653995
  • Filename
    6653995