DocumentCode
20624
Title
Statistical Inference of Component Lifetimes With Location-Scale Distributions From Censored System Failure Data With Known Signature
Author
Jian Zhang ; Ng, Hon Keung Tony ; Balakrishnan, Narayanaswamy
Author_Institution
Dept. of Psychiatry & Behavioral Sci., SUNY Downstate Med. Center, New York, NY, USA
Volume
64
Issue
2
fYear
2015
fDate
Jun-15
Firstpage
613
Lastpage
626
Abstract
Statistical inference of the component lifetime distribution is developed when Type-II censored system lifetime data are observed with a known system structure. The component lifetime distributions are assumed to be from either the log-location-scale family of distributions or the location-scale family of distributions. Two estimation methods, the maximum likelihood method, and the regression-based method, are proposed for the model parameters, and the corresponding computational formulae are provided. Construction of confidence intervals for the model parameters is also considered. The methodologies are illustrated with two commonly used lifetime distributions: the Weibull, and the lognormal. Monte Carlo simulations are used to study the performances of the point and interval estimation methods proposed here. Finally, some recommendations are made based on the obtained simulation results.
Keywords
Monte Carlo methods; Weibull distribution; durability; failure (mechanical); inference mechanisms; log normal distribution; maximum likelihood estimation; mechanical engineering computing; regression analysis; Monte Carlo simulation; Type-II censored system lifetime data; Weibull distribution; component lifetime distribution; computational formulae; confidence intervals; estimation methods; location-scale family; log normal distribution; log-location-scale family; maximum likelihood method; model parameters; regression-based method; statistical inference; Least squares approximations; Maximum likelihood estimation; Probability density function; Reliability; Standards; Best linear unbiased estimator; Monte Carlo simulation; maximum likelihood estimator; system reliability; type-II censoring;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2015.2417373
Filename
7083732
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