• DocumentCode
    20624
  • Title

    Statistical Inference of Component Lifetimes With Location-Scale Distributions From Censored System Failure Data With Known Signature

  • Author

    Jian Zhang ; Ng, Hon Keung Tony ; Balakrishnan, Narayanaswamy

  • Author_Institution
    Dept. of Psychiatry & Behavioral Sci., SUNY Downstate Med. Center, New York, NY, USA
  • Volume
    64
  • Issue
    2
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    613
  • Lastpage
    626
  • Abstract
    Statistical inference of the component lifetime distribution is developed when Type-II censored system lifetime data are observed with a known system structure. The component lifetime distributions are assumed to be from either the log-location-scale family of distributions or the location-scale family of distributions. Two estimation methods, the maximum likelihood method, and the regression-based method, are proposed for the model parameters, and the corresponding computational formulae are provided. Construction of confidence intervals for the model parameters is also considered. The methodologies are illustrated with two commonly used lifetime distributions: the Weibull, and the lognormal. Monte Carlo simulations are used to study the performances of the point and interval estimation methods proposed here. Finally, some recommendations are made based on the obtained simulation results.
  • Keywords
    Monte Carlo methods; Weibull distribution; durability; failure (mechanical); inference mechanisms; log normal distribution; maximum likelihood estimation; mechanical engineering computing; regression analysis; Monte Carlo simulation; Type-II censored system lifetime data; Weibull distribution; component lifetime distribution; computational formulae; confidence intervals; estimation methods; location-scale family; log normal distribution; log-location-scale family; maximum likelihood method; model parameters; regression-based method; statistical inference; Least squares approximations; Maximum likelihood estimation; Probability density function; Reliability; Standards; Best linear unbiased estimator; Monte Carlo simulation; maximum likelihood estimator; system reliability; type-II censoring;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2015.2417373
  • Filename
    7083732