DocumentCode :
2063557
Title :
A survey on different keeper design topologies for high speed wide AND-OR domino circuits
Author :
Rani, Puja ; Pandey, Akhilesh Kumar ; Nagaria, R.K. ; Mishra, R.A.
Author_Institution :
Dept. of Electron. & Commun. Eng., Motilal Nehru Nat. Inst. of Technol., Allahabad, India
fYear :
2012
fDate :
16-18 March 2012
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, we analyze and compare different keeper design topologies for lowering the active mode power consumption, increasing the speed, enhancing the noise immunity and reducing the subthreshold leakage energy of domino logic circuits. This work briefly surveys domino keeper techniques for high fan-in domino circuits. We compared the power, delay, process tracking and VDD tracking of different topologies. These topologies have been prototyped in 130nm CMOS technology at 125°C temperature. The simulation results reveal that conditional keeper technique gives the better results in terms of reduction in delay, power consumption whereas Leakage current replica (LCR) based keeper shows superior performance in terms of noise overhead, process variation and VDD tracking as compared to other alternatives keepers. As compare to conventional circuit, conditional keeper gives 55% reduction in delay as well as 15% reduction in power while leakage current replica (LCR) gives 95% reduction in noise overhead and providing capability of process and VDD tracking.
Keywords :
leakage currents; logic circuits; logic design; low-power electronics; CMOS technology; LCR based keeper; VDD tracking; active mode power consumption; conditional keeper; conventional circuit; delay tracking; domino keeper techniques; domino logic circuits; fan-in domino circuits; high speed wide AND-OR domino circuits; keeper design topology; leakage current replica; noise immunity; noise overhead; power tracking; process tracking; process variation; size 130 nm; subthreshold leakage energy; temperature 125 C; Clocks; Delay; Leakage current; Logic gates; Noise; Robustness; Topology; Keeper; Leakage current; Process variation; Robustness; Wide Domino Circuit;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering and Systems (SCES), 2012 Students Conference on
Conference_Location :
Allahabad, Uttar Pradesh
Print_ISBN :
978-1-4673-0456-6
Type :
conf
DOI :
10.1109/SCES.2012.6199055
Filename :
6199055
Link To Document :
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