DocumentCode
2064366
Title
Microwave Heating for VLSI Processing
Author
Buchta, R. ; Boling, G. ; Sellberg, F. ; Sigurd, D.
Author_Institution
Swedish Institute of Microelectronics, P.O. Box 1084, S-164 21 Kista, Sweden
Volume
1
fYear
1992
fDate
5-9 Sept. 1992
Firstpage
34
Lastpage
46
Abstract
Rapid Thermal Processing (RTP) will be necessary to meet the limited temperature budget in submicron VLSI manufacturing. In this paper we present a reactor concept for LPCVD and other thermal processes, utilizing microwave energy to heat silicon wafers to the required temperature. The reactor, in the form of a single mode microwave cavity allows us to uniformly heat a 100 mm silicon wafer in the temperature range 300 to 450°C with a temperature variation of less then +/- 5°C and in the range 450 to 1000°C with about +/- 10°C variation across the wafer. This paper presents the principle of microwave heating and experimental results on some process steps like selective and blanket tungsten deposition, in situ plasma cleaning, dopant activation, silicide formation and curing processes.
Keywords
Cleaning; Electromagnetic heating; Inductors; Manufacturing processes; Plasma temperature; Rapid thermal processing; Silicon; Temperature distribution; Tungsten; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1992. 22nd European
Conference_Location
Helsinki, Finland
Type
conf
DOI
10.1109/EUMA.1992.335720
Filename
4135431
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