DocumentCode
20662
Title
Design Techniques to Improve Blocker Tolerance of Continuous-Time
ADCs
Author
Geddada, Hemasundar Mohan ; Chang-Joon Park ; Hyung-Joon Jeon ; Silva-Martinez, Jose ; Karsilayan, Aydin Ilker ; Garrity, Douglas
Author_Institution
Texas A&M Univ., College Station, TX, USA
Volume
23
Issue
1
fYear
2015
fDate
Jan. 2015
Firstpage
54
Lastpage
67
Abstract
Design techniques to provide robustness against loop saturation due to blockers in ΣA modulators are presented. Loop overload detection and correction are employed to improve the analog-to-digital converters (ADCs) tolerance to strong blockers; a fast overload detector activates the input attenuator, maintaining the ADC in linear operation. To further improve ADCs blocker tolerance, a minimally invasive integrated low-pass filter that reduces the most critical adjacent/alternate channel blockers is implemented. Measurement results show that the proposed ADC implemented in a 90nm CMOS process achieves 69dB dynamic range over a 20MHz bandwidth with a sampling frequency of 500 MHz and 17.1 mW of power consumption. The alternate channel blocker tolerance at the most critical frequency is as high as -5.5 dBFS while the conventional feedforward modulator becomes unstable at -23.5 dBFS of blocker power. The proposed blocker rejection techniques are minimally invasive and take less than 0.3 μs to settle after a strong agile blocker appears.
Keywords
CMOS integrated circuits; analogue-digital conversion; delta-sigma modulation; low-pass filters; CMOS process; analog-to-digital converters; blocker rejection techniques; blocker tolerance improvement; continuous-time ΔΣ ADC; design techniques; frequency 500 MHz; linear operation; loop correction; loop overload detection; loop saturation; minimally invasive integrated low-pass filter; power 17.1 mW; size 90 nm; Clocks; Feedforward neural networks; Gain; Jitter; Modulation; Noise; Transfer functions; Analog-to-digital converter (ADC); blockers; broadband radio receivers; continuous-time sigma-delta modulation; digital calibration; digital-to-analog converter (DAC); jitter; low power; low power.;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2014.2303815
Filename
6756987
Link To Document