• DocumentCode
    2068271
  • Title

    Saturation avoidance by adaptive fringe projection in phase-shifting 3D surface-shape measurement

  • Author

    Waddington, Christopher ; Kofman, Jonathan

  • Author_Institution
    Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2010
  • fDate
    25-27 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Fringe-pattern projection systems are capable of non-contacting 3D surface full-field measurement with high accuracy. However, the systems are prone to intensity saturation and low signal-to-noise ratio (SNR) when measuring objects with a large range of reflectivity across the surface. Intensity saturation occurs when the light intensity directed to the camera exceeds the maximum intensity quantization level. A low SNR occurs when there is a low intensity modulation compared to the amount of noise in the image. Saturation and low SNR can result in significant measurement error. This paper presents a method for saturation avoidance during object-surface measurement, by adaptively adjusting the projected fringe-pattern intensities, through the maximum input gray level (MIGL). A high SNR can be maintained while avoiding saturation by combining the intensities from phase-shifted images captured at different MIGL, into a set of composite phase-shifted images. In measurement of a black and white checkerboard at different depths, the newly developed method reduced errors by an average 0.25 mm compared to the highest accuracy measurement using a uniform MIGL.
  • Keywords
    phase shifting interferometry; shape measurement; surface topography measurement; adaptive fringe projection; fringe pattern; maximum input gray level; object surface measurement; phase shifting 3D surface shape measurement; phase-shifting fringe-pattern projection; saturation avoidance; Accuracy; Apertures; Cameras; Optics; Phase measurement; Pixel; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optomechatronic Technologies (ISOT), 2010 International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-7684-8
  • Type

    conf

  • DOI
    10.1109/ISOT.2010.5687390
  • Filename
    5687390