• DocumentCode
    2068671
  • Title

    Modelling of the susceptibility of 90 nm input output buffer

  • Author

    Boyer, A. ; Fer, M. ; Courau, L. ; Sicard, E. ; Dhia, S. Ben

  • Author_Institution
    INSA, Univ. of Toulouse, Toulouse
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    32
  • Lastpage
    35
  • Abstract
    This paper deals with the modelling of the susceptibility to RF aggression of several input buffers structures implemented in a 90 nm test-chip. Measurement results, model construction and simulation flow are detailed.
  • Keywords
    buffer circuits; integrated circuits; radiofrequency interference; RF aggression; input output buffer; susceptibility; CMOS technology; Capacitors; Circuit simulation; Circuit testing; Electromagnetic compatibility; Electromagnetic measurements; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit testing; Packaging; IC; Input-Output Buffer; susceptibility measurement and modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559804
  • Filename
    4559804
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2068671