DocumentCode
20688
Title
Modal Analysis of Substrate Integrated Waveguides With Rectangular Via-Holes Using Cavity and Multilayer Green´s Functions
Author
Kehn, Malcolm Ng Mou
Author_Institution
Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
62
Issue
10
fYear
2014
fDate
Oct. 2014
Firstpage
2214
Lastpage
2231
Abstract
The substrate integrated waveguide (SIW) comprising rectangular via-holes is herein treated by a rigorous full-wave modal analysis using the moment method entailing Green´s functions for rectangular cavities and planar multilayer structures in the spectral domain. Modal dispersion graphs generated by this solution approach are compared with those obtained by an independent commercial full-wave solver. The ability of the modal solution in treating SIW junctions and discontinuities is demonstrated by the treatment of an interconnection between a conventional waveguide and a SIW using the mode-matching technique. Inhomogeneities within SIWs can also be accommodated by the technique, as showcased by a specific example of the so-called hard sidewalled SIW. Three avenues of losses, namely, dielectric, side-leakage, and conductor losses, are also investigated, thereby elucidating a tradeoff between the latter two.
Keywords
Green´s function methods; dielectric losses; graph theory; modal analysis; mode matching; spectral analysis; substrate integrated waveguides; conductor losses; dielectric losses; hard sidewalled SIW; independent commercial full-wave solver; modal dispersion graphs; mode-matching technique; multilayer Green functions; planar multilayer structures; rectangular cavities; rectangular via-holes; side-leakage losses; spectral domain; substrate integrated waveguides; Apertures; Cavity resonators; Equations; Green´s function methods; Magnetic cores; Magnetic multilayers; Nonhomogeneous media; Green´s function; moment method; spectral-domain technique; substrate integrated waveguide (SIW);
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2014.2344626
Filename
6874592
Link To Document