DocumentCode :
2070148
Title :
Conductive adhesive flip-chip bonding for bumped and unbumped die
Author :
Connell, Glen ; Zenner, Robert L D ; Gerber, Joel A.
Author_Institution :
3M Co., St. Paul, MN, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
274
Lastpage :
278
Abstract :
Conductive adhesive interconnection for flip-chip-on-flex is discussed for both bumped and unbumped die. The flip-chip connections are made by applying heat and pressure to a conductive adhesive film. During the bonding process adhesive is pushed out of the way allowing the conductive particles to connect to the conductive pads and traces. If the proper conditions are applied, a reliable connection is made. The most stable connections were made with a gold-bumped die. However, reliable connections to unbumped die were also demonstrated using gold-coated nickel particles. The samples were prepared by patterning the particles in a grid array and then directing the flow of the adhesive towards the center of the chip rather than outward. This directed flow is accomplished by allowing the, chip to deflect under the influence of the adhesive pressure. Results for both kind of die show that once a good initial contact is made, the resistance is stable in accelerated aging environments
Keywords :
adhesion; flip-chip devices; Au-Ni; accelerated aging; bonding; bumped die; conductive adhesive film; flip-chip-on-flex; gold-coated nickel particles; interconnection; resistance; unbumped die; Bonding processes; Conductive adhesives; Contact resistance; Costs; Insulation; Polyethylene; Positron emission tomography; Substrates; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606181
Filename :
606181
Link To Document :
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