DocumentCode :
2070506
Title :
Effect of small Sn-Ag-Cu additions on structure and properties of Sn-Zn-Bi solder/BGA during as-soldered and as-aged conditions
Author :
Gain, A.K. ; Chan, Y.C. ; Sharif, Ahmed ; Yung, Winco K. C.
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon
fYear :
2009
fDate :
26-29 May 2009
Firstpage :
1021
Lastpage :
1026
Abstract :
Sn-8Zn-3Bi solder balls with different weight percentages of Sn-Ag-Cu addition were bonded to Au/Ni metallized Cu pads, and the effect of multiple reflow and aging on impact reliability was investigated. In the Sn-Ag-Cu content Sn-Zn-Bi solder joints, the AgZn3 intermetallic compound layer was clearly observed at the interfaces and its thickness increased with an increase the number of reflow cycles and aging time. In the solder ball region, fine acicular-shaped Zn-rich phase and spherical-shaped AgZn3 compound particles were found in szlig-Sn matrix. The shear strength of monolithic Sn-Zn-Bi and 7 wt% Sn-Ag-Cu content Sn-Zn-Bi solder joints after one reflow cycle were about 44.5 MPa and 53.1 MPa, respectively while their shear strengths after eight reflow cycles were about 43.4 MPa and 51.6 MPa, respectively. The fracture surface of monolithic Sn-Zn-Bi solder exhibited a semi ductile fracture mode with a smooth surface while Sn-Zn-Bi solder joints containing Sn-Ag-Cu particles showed a typical ductile failure with very rough dimpled surfaces.
Keywords :
ageing; ball grid arrays; bismuth alloys; copper alloys; ductile fracture; fracture toughness; gold alloys; metallisation; nickel alloys; reflow soldering; reliability; shear strength; silver alloys; solders; tin alloys; zinc alloys; Au-Cu; BGA; Ni-Cu; SnAgCuSnZnBi; aging; gold metallized copper pad; intermetallic compound layer; monolithic solder fracture surface; multiple reflow effect; nickel metallized copper pad; pressure 43.4 MPa; pressure 44.5 MPa; pressure 51.6 MPa; pressure 53.1 MPa; rough dimpled surface; semi ductile fracture mode; shear strength; solder ball; solder joint reliability; Electronics industry; Electronics packaging; Environmentally friendly manufacturing techniques; Lead; Microelectronics; Oxidation; Rough surfaces; Soldering; Surface cracks; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4244-4475-5
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2009.5074137
Filename :
5074137
Link To Document :
بازگشت