• DocumentCode
    2071827
  • Title

    Impacts of bends and ground return vias on interconnects for high speed GHz designs

  • Author

    Chang, R.W.-Y. ; See, Kye-Yak ; Tan, Yang-Long

  • Author_Institution
    Guided Syst. Div., DSO Nat. Labs., Singapore
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    502
  • Lastpage
    505
  • Abstract
    In the past only critical clock circuits are running at high speed but this is no longer true in today high-speed digital design world. Most of the digital traces on board are running at speed in excess of 200 MHz and drivers output with rise time less than 1 ns. Due to constraints of board size and highly complex designs, trace bends and inter-layer transitions through vias are unavoidable. This paper carries out a comprehensive study on the impacts of bends and ground return vias optimisation on signal integrity performance using a full-wave electromagnetic simulator. (CST Microwave Studio). This study will provide high-speed digital designers an in-depth assessment of these effects in high-speed GHz applications so that some design guides to avoid these effects can be established.
  • Keywords
    circuit noise; clocks; digital circuits; driver circuits; interconnections; printed circuits; complex designs; critical clock circuits; drivers; full-wave electromagnetic simulator; high-speed digital designers; signal integrity performance; Analytical models; Clocks; Electromagnetic compatibility; Impedance; Insertion loss; Integrated circuit interconnections; Performance analysis; Routing; Scattering parameters; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4559922
  • Filename
    4559922