• DocumentCode
    2073665
  • Title

    Electromagnetic topology analysis on relation between electromagnetic interference inside equipment and external electrostatic discharge

  • Author

    Niu, Bo ; Song, Zhengxiang ; Geng, Yingsan ; Wang, Jianhua ; Wang, Jing

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    815
  • Lastpage
    818
  • Abstract
    Simulation based on electromagnetic topology theory was applied to analyze the relationship between internal electromagnetic interference (EMI) and external electrostatic discharge (ESD) of semi-shielded electrical equipment. The topological structure model of the equipment was built to analyze the coupling paths of external disturbance. To the aperture coupling path, a new method was adopted to determine the transfer function between external disturbance and internal sensitive component, which was modeled as a wire conductor in this paper. The simulation result shows that the EMI induced by external ESD on the wire conductor depends on its length and location. The results compare well with previous reports.
  • Keywords
    electromagnetic interference; electromagnetic shielding; electrostatic discharge; EMI; ESD; aperture coupling path; electromagnetic interference; electromagnetic topology analysis; external disturbance coupling paths; external electrostatic discharge; internal sensitive component; semi-shielded electrical equipment; transfer function; Analytical models; Apertures; Conductors; Electromagnetic analysis; Electromagnetic interference; Electrostatic analysis; Electrostatic discharge; Electrostatic interference; Topology; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4560000
  • Filename
    4560000