DocumentCode
2073665
Title
Electromagnetic topology analysis on relation between electromagnetic interference inside equipment and external electrostatic discharge
Author
Niu, Bo ; Song, Zhengxiang ; Geng, Yingsan ; Wang, Jianhua ; Wang, Jing
Author_Institution
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an
fYear
2008
fDate
19-23 May 2008
Firstpage
815
Lastpage
818
Abstract
Simulation based on electromagnetic topology theory was applied to analyze the relationship between internal electromagnetic interference (EMI) and external electrostatic discharge (ESD) of semi-shielded electrical equipment. The topological structure model of the equipment was built to analyze the coupling paths of external disturbance. To the aperture coupling path, a new method was adopted to determine the transfer function between external disturbance and internal sensitive component, which was modeled as a wire conductor in this paper. The simulation result shows that the EMI induced by external ESD on the wire conductor depends on its length and location. The results compare well with previous reports.
Keywords
electromagnetic interference; electromagnetic shielding; electrostatic discharge; EMI; ESD; aperture coupling path; electromagnetic interference; electromagnetic topology analysis; external disturbance coupling paths; external electrostatic discharge; internal sensitive component; semi-shielded electrical equipment; transfer function; Analytical models; Apertures; Conductors; Electromagnetic analysis; Electromagnetic interference; Electrostatic analysis; Electrostatic discharge; Electrostatic interference; Topology; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-981-08-0629-3
Electronic_ISBN
978-981-08-0629-3
Type
conf
DOI
10.1109/APEMC.2008.4560000
Filename
4560000
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