• DocumentCode
    2074059
  • Title

    Numerical modeling and measurements on the shielding effectiveness of enclosure with apertures

  • Author

    Kwon, Jong Hwa ; Choi, Hyung-Do ; Park, Hyun H. ; Yook, Jong Gwan

  • Author_Institution
    Radio & Broadcasting Res. Div., ETRI, Daejeon
  • fYear
    2008
  • fDate
    19-23 May 2008
  • Firstpage
    887
  • Lastpage
    890
  • Abstract
    Generally, most of the electronic equipments need a metallic enclosure in order to mechanically protect and to electrically shield the interior printed circuit boards (PCBs) and subsystems. But in the practical situations, the apertures or slots of various forms are essential parts of the shielding enclosure for heat dissipation, CD-ROMs, connectors, I/O cabling and so on. The performance of shielding enclosures for high-speed digital systems is compromised by those inevitable discontinuities on enclosure. To minimize the electromagnetic interference and susceptibility risk by those discontinuities, the shielding enclosures with apertures should be designed based on the thorough analysis about the electromagnetic coupling mechanism through apertures. In this paper, the effect of apertures on shielding effectiveness of the enclosure is studied with the finite-difference time-domain (FDTD) method. And the simulated SE data are verified numerically and experimentally. Good agreements are seen. Also several guidelines on the apertures design of shielding enclosure are verified with the numerical methods.
  • Keywords
    electromagnetic coupling; electromagnetic interference; electromagnetic shielding; electronic equipment testing; finite difference time-domain analysis; printed circuits; electromagnetic coupling mechanism; electromagnetic interference; electromagnetic susceptibility risk; electronic equipments; finite-difference time-domain method; high-speed digital systems; interior printed circuit boards; shielding effectiveness; Apertures; Cable shielding; Connectors; Digital systems; Electronic equipment; Finite difference methods; Numerical models; Printed circuits; Protection; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-981-08-0629-3
  • Electronic_ISBN
    978-981-08-0629-3
  • Type

    conf

  • DOI
    10.1109/APEMC.2008.4560018
  • Filename
    4560018