• DocumentCode
    2074956
  • Title

    A Microwave System for High Accuracy High Spatial Resolution Dielectric Constant Uniformity Measurement

  • Author

    Bhimnathwala, H.B. ; Wang, M.S. ; Bothra, S. ; Kristal, K.W. ; Borrego, J.M.

  • Author_Institution
    Rensselaer Polytechnic Institute. Troy, NY 12180-3590 USA
  • Volume
    1
  • fYear
    1990
  • fDate
    9-13 Sept. 1990
  • Firstpage
    495
  • Lastpage
    500
  • Abstract
    This paper presents a microwave system using an aperture in a microstrip resonant probe capable of measuring dielectric constant uniformity with high accuracy and high degree of spatial resolution. The volume scanned by the probe aperture is estimated to be 0.0301" × 0.0101" in area and 0.010" in depth and the accuracy achieved in dielectric constant uniformity measurement at 10 Ghz is better than 0.5% by using the resonant probe as part of a frequency discriminator in the measuring system.
  • Keywords
    Apertures; Area measurement; Dielectric constant; Dielectric measurements; Frequency estimation; High-K gate dielectrics; Microwave measurements; Probes; Resonance; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1990. 20th European
  • Conference_Location
    Budapest, Hungary
  • Type

    conf

  • DOI
    10.1109/EUMA.1990.336091
  • Filename
    4136048