Title :
Dielectric Resonator Method for Nondestructive Measurement of Complex Permittivity of Microwave Dielectric Substrates
Author :
Nishikawa, Toshio ; Wakino, Kikuo ; Tanaka, Hiroaki ; Ishikawa, Youhei
Abstract :
A new technique for the measurement of the complex permittivity of dielectric substrates was developed. This method is a non-contact measurement using two dielectric resonators which support the TE016 mode. The complex permittivity is analyzed using finite element method. The nondestructive measurement of located small area in a dielectric substrate can be achieved. This paper describes some examples of measurement.
Keywords :
Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Finite element methods; Frequency measurement; Microwave measurements; Microwave theory and techniques; Permittivity measurement;
Conference_Titel :
Microwave Conference, 1990. 20th European
Conference_Location :
Budapest, Hungary
DOI :
10.1109/EUMA.1990.336092
