DocumentCode :
2075818
Title :
Stable backward reachability correction for PLL verification with consideration of environmental noise induced jitter
Author :
Yang Song ; Haipeng Fu ; Hao Yu ; Guoyong Shi
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2013
fDate :
22-25 Jan. 2013
Firstpage :
755
Lastpage :
760
Abstract :
It is unknown to perform efficient PLL system-level verification with consideration of jitter induced by substrate or power-supply noise. With the consideration of nonlinear phase noise macromodel, this paper introduces a forward reachability analysis with stable backward correction for PLL system-level verification with jitter. By refining initial state of PLL through backward correction, one can perform an efficient PLL verification to automatically adjust the locking range with consideration of environmental noise induced jitter. Moreover, to overcome the unstable nature during backward correction, a stability calibration is introduced in this paper to limit error. To validate our method, the proposed approach is applied to verify a number of PLL designs including single-LC or coupled-LC oscillators described by system-level behavioral model with jitter. Experimental results show that our forward reachability analysis with backward correction can succeed in reaching the adjusted locking range by correcting initial states in presence of environmental noise induced jitter.
Keywords :
jitter; noise; oscillators; phase locked loops; reachability analysis; PLL system level verification; PLL verification; adjusted locking range; coupled LC oscillators; environmental noise induced jitter; forward reachability analysis; limit error; nonlinear phase noise macromodel; power supply noise; stability calibration; stable backward correction; stable backward reachability correction; substrate; system level behavioral model; unstable nature; Jitter; Noise; Oscillators; Phase locked loops; Reachability analysis; Trajectory; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4673-3029-9
Type :
conf
DOI :
10.1109/ASPDAC.2013.6509691
Filename :
6509691
Link To Document :
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