• DocumentCode
    2083162
  • Title

    A Summary of Single Event Upset Testing of CD4000 Series Devices

  • Author

    Lombardi, Robert E. ; Bogorad, Alexander L. ; Likar, Justin J. ; Rubin, Aaron S. ; Camacho, Carlos F.

  • Author_Institution
    Lockheed Martin Space Syst. Co., Newtown, PA, USA
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The results of single event upset (SEU) testing show that HCC4011, HCC4013, and HCC4066 devices are susceptible to transients only, HCC4020B is susceptible to bit upsets, and HCC4041 is immune to single event effects (SEE).
  • Keywords
    CMOS digital integrated circuits; integrated circuit testing; CD4000 Series Devices; CMOS digital devices; CMOS quad 2-input NAND gate; CMOS quad bilateral switch; CMOS ripple-carry binary counter; HCC4011 device; HCC4013 device; HCC4020B device; HCC4066 device; single event upset testing; CMOS integrated circuits; Monitoring; Radiation detectors; Single event upset; Software; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062505
  • Filename
    6062505
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083162