• DocumentCode
    2083167
  • Title

    Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

  • Author

    Hafer, Craig ; Lahey, Mike ; Harris, Debra ; Larsen, Jennifer ; Sievert, Fred ; Sims, Tony ; Meyer, Steve ; Dumitru, Radu ; Jordan, Anthony ; Milliken, Peter

  • Author_Institution
    Aeroflex Colorado Springs, Colorado Springs, CO, USA
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.
  • Keywords
    CMOS digital integrated circuits; radiation effects; CMOS technology; RadHard devices; aeroflex; alternate wafer fab; heavy ion single event effects performance; wafer fabs; Application specific integrated circuits; Arrays; Logic gates; Performance evaluation; Power supplies; Springs; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062506
  • Filename
    6062506
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083167