DocumentCode :
2083597
Title :
Neutron Beam Testing of High Performance Computing Hardware
Author :
Michalak, Sarah E. ; DuBois, Andrew J. ; Storlie, Curtis B. ; Quinn, Heather M. ; Rust, William N. ; DuBois, David H. ; Modl, David G. ; Manuzzato, Andrea ; Blanchard, Sean P.
Author_Institution :
Stat. Sci. Group, Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear :
2011
fDate :
25-29 July 2011
Firstpage :
1
Lastpage :
8
Abstract :
Microprocessor-based systems are the most common design for high-performance computing (HPC) platforms. In these systems, several thousands of microprocessors can participate in a single calculation that could take weeks or months to complete. When used in this manner, a fault in any of the microprocessors could cause the computation to crash or cause silent data corruption (SDC), i.e.~computationally incorrect results. In recent years, neutron-induced failures in HPC hardware have been observed, and researchers have started to study how neutron radiation affect microprocessor-based scientific computations. This paper presents results from an accelerated neutron test focusing on two microprocessors used in Roadrunner, the first Petaflop system.
Keywords :
microprocessor chips; neutron effects; Petaflop system; Roadrunner; high performance computing hardware; microprocessor-based systems; neutron beam testing; neutron radiation; neutron-induced failures; silent data corruption; Blades; Computer architecture; Hardware; Microprocessors; Neutrons; Program processors; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
ISSN :
2154-0519
Print_ISBN :
978-1-4577-1281-4
Type :
conf
DOI :
10.1109/REDW.2010.6062525
Filename :
6062525
Link To Document :
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