• DocumentCode
    2083597
  • Title

    Neutron Beam Testing of High Performance Computing Hardware

  • Author

    Michalak, Sarah E. ; DuBois, Andrew J. ; Storlie, Curtis B. ; Quinn, Heather M. ; Rust, William N. ; DuBois, David H. ; Modl, David G. ; Manuzzato, Andrea ; Blanchard, Sean P.

  • Author_Institution
    Stat. Sci. Group, Los Alamos Nat. Lab., Los Alamos, NM, USA
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Microprocessor-based systems are the most common design for high-performance computing (HPC) platforms. In these systems, several thousands of microprocessors can participate in a single calculation that could take weeks or months to complete. When used in this manner, a fault in any of the microprocessors could cause the computation to crash or cause silent data corruption (SDC), i.e.~computationally incorrect results. In recent years, neutron-induced failures in HPC hardware have been observed, and researchers have started to study how neutron radiation affect microprocessor-based scientific computations. This paper presents results from an accelerated neutron test focusing on two microprocessors used in Roadrunner, the first Petaflop system.
  • Keywords
    microprocessor chips; neutron effects; Petaflop system; Roadrunner; high performance computing hardware; microprocessor-based systems; neutron beam testing; neutron radiation; neutron-induced failures; silent data corruption; Blades; Computer architecture; Hardware; Microprocessors; Neutrons; Program processors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062525
  • Filename
    6062525