DocumentCode
2085604
Title
Measuring and improving design patterns testability
Author
Baudry, Benoit ; Traon, Yves Le ; Sunyé, Gerson ; Jézéquel, Jean-Marc
Author_Institution
IRISA, Rennes, France
fYear
2003
fDate
3-5 Sept. 2003
Firstpage
50
Lastpage
59
Abstract
We address not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testability anti-patterns) of an OO design is a crucial task, one cannot expect from a non-specialist to make the right improvements, without guidance or automation. To overcome this limitation, we investigate solutions integrated to the OO process. We focus on the design patterns as coherent subsets in the architecture, and we explain how their use can provide a way for limiting the severity of testability weaknesses, and of confining their effects to the classes involved in the pattern. Indeed, design patterns appear both as a usual refinement instrument, and a cause of complex interactions into a class diagram-and more specifically of testability anti-patterns. To reach our objective of integrating the testability improvement to the design process, we propose first a testability grid to make the relation between each pattern and the severity of the testability anti-patterns, and we present our solution, based on a definition of patterns at metalevel, to automate the instantiation of patterns constrained by testability criteria.
Keywords
object-oriented methods; object-oriented programming; program testing; software architecture; software metrics; class diagram interaction; design pattern testability measurement; object oriented design; pattern class; testability anti-patterns; Automatic control; Automatic testing; Computer architecture; Design automation; Guidelines; Instruments; Life testing; Process design; Q factor; Unified modeling language;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Metrics Symposium, 2003. Proceedings. Ninth International
ISSN
1530-1435
Print_ISBN
0-7695-1987-3
Type
conf
DOI
10.1109/METRIC.2003.1232455
Filename
1232455
Link To Document