DocumentCode
2086643
Title
@tComment: Testing Javadoc Comments to Detect Comment-Code Inconsistencies
Author
Tan, Shin Hwei ; Marinov, Darko ; Tan, Lin ; Leavens, Gary T.
Author_Institution
Univ. of Illinois, Urbana, IL, USA
fYear
2012
fDate
17-21 April 2012
Firstpage
260
Lastpage
269
Abstract
Code comments are important artifacts in software. Javadoc comments are widely used in Java for API specifications. API developers write Javadoc comments, and API users read these comments to understand the API, e.g., reading a Javadoc comment for a method instead of reading the method body. An inconsistency between the Javadoc comment and body for a method indicates either a fault in the body or, effectively, a fault in the comment that can mislead the method callers to introduce faults in their code. We present a novel approach, called @TCOMMENT, for testing Javadoc comments, specifically method properties about null values and related exceptions. Our approach consists of two components. The first component takes as input source files for a Java project and automatically analyzes the English text in Javadoc comments to infer a set of likely properties for a method in the files. The second component generates random tests for these methods, checks the inferred properties, and reports inconsistencies. We evaluated @TCOMMENT on seven open-source projects and found 29 inconsistencies between Javadoc comments and method bodies. We reported 16 of these inconsistencies, and 5 have already been confirmed and fixed by the developers.
Keywords
Java; application program interfaces; formal specification; natural language processing; program testing; text analysis; @TCOMMENT; API specification; English text analysis; Javadoc comment testing; comment-code inconsistency detection; software artifact; Arrays; Contracts; Educational institutions; Java; Libraries; Synchronization; Testing; comment analysis; random testing; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Testing, Verification and Validation (ICST), 2012 IEEE Fifth International Conference on
Conference_Location
Montreal, QC
Print_ISBN
978-1-4577-1906-6
Type
conf
DOI
10.1109/ICST.2012.106
Filename
6200082
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