DocumentCode
2089395
Title
Fault analysis of the multiple valued logic using spectral method
Author
Kim, Young Gun ; Lala, Parag ; Young Gun Kim ; Heung Soo Kim
Author_Institution
Dept. of Electr. Eng., Dongyang Tech. Coll., Seoul, South Korea
fYear
2000
fDate
2000
Firstpage
59
Lastpage
64
Abstract
A method for detecting faults in Multiple Valued Logic (MVL) is proposed. The method depends on analyzing the spectral coefficients that are transformed for the Chrestenson spectral domain. The fault detecting conditions are derived for a single input stuck-at fault, multiple input s-a-f, a s-a-f at internal lines, and Min/Max bridging fault of the MVL. Fault detection is done based on the number of coefficients affected by a fault, and hence it is independent of the technology used for construction of networks and the types of fault. This method allows detection of the fault without the test vector, and minimize the memory size for storing test vectors and response data
Keywords
logic testing; multivalued logic; fault detecting; fault detection; multiple valued logic; spectral method; test vectors; Multivalued logic;
fLanguage
English
Publisher
ieee
Conference_Titel
Multiple-Valued Logic, 2000. (ISMVL 2000) Proceedings. 30th IEEE International Symposium on
Conference_Location
Portland, OR
ISSN
0195-623X
Print_ISBN
0-7695-0692-5
Type
conf
DOI
10.1109/ISMVL.2000.848601
Filename
848601
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