• DocumentCode
    2089395
  • Title

    Fault analysis of the multiple valued logic using spectral method

  • Author

    Kim, Young Gun ; Lala, Parag ; Young Gun Kim ; Heung Soo Kim

  • Author_Institution
    Dept. of Electr. Eng., Dongyang Tech. Coll., Seoul, South Korea
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    59
  • Lastpage
    64
  • Abstract
    A method for detecting faults in Multiple Valued Logic (MVL) is proposed. The method depends on analyzing the spectral coefficients that are transformed for the Chrestenson spectral domain. The fault detecting conditions are derived for a single input stuck-at fault, multiple input s-a-f, a s-a-f at internal lines, and Min/Max bridging fault of the MVL. Fault detection is done based on the number of coefficients affected by a fault, and hence it is independent of the technology used for construction of networks and the types of fault. This method allows detection of the fault without the test vector, and minimize the memory size for storing test vectors and response data
  • Keywords
    logic testing; multivalued logic; fault detecting; fault detection; multiple valued logic; spectral method; test vectors; Multivalued logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multiple-Valued Logic, 2000. (ISMVL 2000) Proceedings. 30th IEEE International Symposium on
  • Conference_Location
    Portland, OR
  • ISSN
    0195-623X
  • Print_ISBN
    0-7695-0692-5
  • Type

    conf

  • DOI
    10.1109/ISMVL.2000.848601
  • Filename
    848601