Title :
Evolution of multi-valley electron distributions in GaAs
Author :
Chennupati, Rambabu ; Cheng, Ming C.
Author_Institution :
Dept. of Electr. Eng., New Orleans Univ., LA, USA
Abstract :
An approach based on the physical evolution of the distribution function in the energy relaxation scale is used to study multi-valley distribution functions of electrons in GaAs subjected to a rapid change in electric field. This approach, which assumes the distribution can be determined by mean energy, is able to describe transport phenomena, including inter-valley transitions, in the scale as small as the energy relaxation time. Results show that, near the peak of velocity overshoot and bottom of undershoot in the Γ valley, the energy-dependent distribution cannot respond as fast as the distribution obtained from Monte Carlo method. This results in less pronounced overshoot and undershoot in the Γ valley when using the introduced approach than using the Monte Carlo method. However, in the L valley, overshoot and undershoot are not pronounced, and these two approaches are in very good agreement
Keywords :
III-V semiconductors; Monte Carlo methods; carrier relaxation time; gallium arsenide; many-valley semiconductors; GaAs; Monte Carlo method; energy relaxation; inter-valley transitions; multi-valley electron distribution function; rapid electric field change; transport phenomena; undershoot; velocity overshoot; Distribution functions; Electron emission; Equations; Gallium arsenide; Hydrodynamics; MOSFET circuits; Scattering; Secondary generated hot electron injection; Semiconductor devices; Thermionic emission;
Conference_Titel :
Southeastcon '94. Creative Technology Transfer - A Global Affair., Proceedings of the 1994 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
0-7803-1797-1
DOI :
10.1109/SECON.1994.324355