• DocumentCode
    2089935
  • Title

    Characterization of thin films of ZnO prepared by sol-gel processes

  • Author

    Bahadur, H. ; Kishore, R. ; Sood, K.N. ; Rashmi ; Sharma, R.K. ; Basu, A. ; Haranath, D. ; Chander, H. ; Chandra, S.

  • Author_Institution
    Nat. Phys. Lab., New Delhi
  • fYear
    2004
  • fDate
    5-7 April 2004
  • Firstpage
    87
  • Lastpage
    91
  • Abstract
    Thin films of ZnO have been grown using sol-gel technique. The precursor materials for sol preparation include zinc acetate or zinc nitrate. Characterization was done using optical absorption, ellipsometry, X-ray diffraction, photoluminescence and scanning electron microscopy.
  • Keywords
    X-ray diffraction; light absorption; photoluminescence; scanning electron microscopy; sol-gel processing; thin films; zinc compounds; X-ray diffraction; ZnO; ellipsometry; optical absorption; photoluminescence microscopy; precursor materials; scanning electron microscopy; sol-gel processes; thin film characterization; zinc acetate; zinc nitrate; Electron Microscopy; Ellipsometry; Thin films; XRD; Zinc oxide; sol-gel;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Frequency and Time Forum, 2004. EFTF 2004. 18th European
  • Conference_Location
    Guildford
  • ISSN
    0537-9989
  • Print_ISBN
    0-86341-384-6
  • Type

    conf

  • Filename
    5074914