• DocumentCode
    2090429
  • Title

    FGMOS Based Built-In Current Sensor for Low Supply Voltage Analog and Mixed-Signal Circuits Testing

  • Author

    Siskos, S.

  • Author_Institution
    Phys. Dept., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
  • fYear
    2010
  • fDate
    5-7 July 2010
  • Firstpage
    259
  • Lastpage
    264
  • Abstract
    A simple current mirror using floating-gate MOS transistors (FGMOS) operating in the linear region is used in this work, to design a built-in current sensor (BICS). The important feature in this application is that the voltage drop across the sensing device can be reduced to almost zero value (less than 50 mV). This makes the proposed BICS appropriate for modern very low supply voltage applications. The proposed BICS in conjunction with an RMS-to-DC converter and a novel current window comparator can be used to efficiently achieve supply current monitoring of analog and mixed-signal circuit testing.
  • Keywords
    MOSFET circuits; analogue circuits; built-in self test; circuit testing; current mirrors; electric current measurement; mixed analogue-digital integrated circuits; FGMOS based built-in current sensor; current mirror; current monitoring; floating gate MOS transistors; low supply voltage analog circuit testing; mixed-signal circuits testing; Capacitance; Converters; Mirrors; Monitoring; Testing; Threshold voltage; Transistors; Built-in current sensor; analog and mixed signal testing; floating-gate MOS transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Lixouri, Kefalonia
  • Print_ISBN
    978-1-4244-7321-2
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2010.31
  • Filename
    5572782